Explore the critical world of Analogue-to-Digital Converters (ADCs) with “Dynamic Characterisation of Analogue-to-Digital Converters”. As essential components in modern electronic systems, understanding ADC dynamic behavior is key to optimizing performance and selecting the right architecture. This comprehensive guide, part of The Springer International Series in Engineering and Computer Science, provides a state-of-the-art overview of ADC characterization methods using sinusoidal stimuli. It thoroughly details classical techniques like histogram, sine wave fitting, and spectral analysis, while also introducing novel approaches to overcome their limitations. Essential for academics and test professionals, this book offers a deep dive into the underlying mathematics and practical implementation details for accurate ADC testing. Enhance your understanding and improve system design with this vital resource for electronic engineers and signal processing professionals.