Name: Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits
SKU: 9788184894295
Availability: InStock

Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits

SKU: 9788184894295

Explore advanced defect-oriented testing strategies for nano-metric CMOS VLSI circuits with this essential guide from ‘The Bookish Owl’. Authored for engineers and researchers in the field of electronic testing, this book delves into critical methodologies ensuring the reliability and performance of modern integrated circuits. Discover cutting-edge techniques and practical applications necessary for tackling the complexities of nano-scale semiconductor manufacturing. Enhance your understanding of fault modeling, test pattern generation, and defect diagnosis to optimize your VLSI design and verification processes. Ideal for professionals seeking to master the latest in defect-oriented testing for nano-metric technologies.

5 in stock