Integrated Circuit Test Engineering : Modern Techniques

ISBN-10: 1846280230
ISBN-13: 978-1846280238
Edition: 2006th
Publication date: 1 January 2006

Name: Integrated Circuit Test Engineering : Modern Techniques
SKU: 9781846280238
Availability: InStock

SKU: 9781846280238

Original price was: ₹2,995.00.Current price is: ₹1,946.75.

Discover the cutting-edge of semiconductor reliability with “Integrated Circuit Test Engineering: Modern Techniques.” This essential guide from Springer Paperback provides deep insights into the latest methodologies and best practices for testing complex integrated circuits. Ideal for engineers, researchers, and students in the field, this book covers crucial aspects of modern test engineering, ensuring optimal performance and quality for your IC designs. Enhance your expertise in this vital area of electronics with this comprehensive and up-to-date resource from The Bookish Owl. Explore advanced techniques to tackle the challenges of today’s integrated circuits and advance your career in semiconductor testing.

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Category: Higher Education Textbooks Tag: Grout I.a.