Unlock the power of data mining for diagnosing integrated circuit (IC) failures with “Data Mining and Diagnosing IC Fails” from the “Frontiers in Electronic Testing” series. This essential guide, perfect for “The Bookish Owl” catalog, delves into advanced analytical tools developed at IBM. Focusing on techniques with significant statistical and data-mining components, this book expertly balances straightforward analysis ideas with rigorous mathematical proofs. Part one explores experimental results and practical applications, while part two provides comprehensive mathematical details for a deeper understanding. Ideal for engineers and researchers seeking to improve IC failure analysis and diagnostic accuracy. Discover innovative methods and gain a robust understanding of complex diagnostic challenges in electronic testing.