Description
This proceedings volume from the Institute of Physics Electron Microscopy and Analysis Group conference series documents significant developments in electron microscopy and analytical techniques as presented in 1987. The collection features contributions from leading researchers in the field, covering cutting-edge methodologies and applications in materials characterization.
Topics include high-resolution electron microscopy, analytical electron microscopy, specimen preparation techniques, and quantitative analysis methods. The papers address both theoretical advances and practical applications in studying crystalline materials, microstructures, and elemental composition analysis. This conference series volume represents important work in advancing understanding of microscopy techniques and their industrial and scientific applications.
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