Description
- ISBN-10: 9783540850380
- ISBN-13: 978-3540850380
- Edition: 2009th
- Publisher: SPRINGER
- Publication date: 1 January 2009
- Language: English
- Dimensions: 15.88 x 1.91 x 23.5 cm
- Print length: 224 pages
Availability: In Stock
APPLIED SCANNING PROBE METHODS XII: CHARACTERIZATION (NANOSCIENCE AND TECHNOLOGY)
SKU: 9783540850380
Original price was: ₹17,168.99.₹11,159.84Current price is: ₹11,159.84.
Explore the latest advancements in nanoscience with ‘APPLIED SCANNING PROBE METHODS XII: CHARACTERIZATION’. This comprehensive hardcover guide, published by Springer in 2009, delves deep into cutting-edge characterization techniques. Essential for researchers, scientists, and students in nanotechnology and materials science, this book provides invaluable insights into scanning probe microscopy. Discover how these advanced methods are shaping the future of nanoscale research and innovation. Perfect for your collection at The Bookish Owl, this 224-page volume is a must-have for anyone serious about understanding and applying scanning probe technologies. Enhance your knowledge and boost your research capabilities with this pivotal publication.
5 in stock
