Synthetic Polymeric Membranes Characterization By Atomic Force Microscopy (Hb 2008)
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Synthetic Polymeric Membranes Characterization By Atomic Force Microscopy (Hb 2008)

SKU: 9783540739937

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Explore the cutting-edge characterization of synthetic polymeric membranes with Atomic Force Microscopy (AFM) in this essential guide from The Bookish Owl. Perfect for researchers and R&D professionals, this comprehensive volume delves into the principles and applications of AFM for studying membrane surfaces. Discover current research trends and gain valuable insights for future investigations into polymeric membranes. This book provides a foundational understanding of AFM techniques, making it an indispensable resource for advancing knowledge in membrane science and technology. Enhance your research with detailed overviews and practical guidelines for using this powerful analytical tool.

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Description

  • ISBN-10: 3540739939
  • ISBN-13: 978-3540739937
  • Edition: 2008th
  • Publisher: Springer
  • Publication date: 17 December 2007
  • Language: English
  • Dimensions: 16 x 1.52 x 23.88 cm
  • Print length: 198 pages

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