Description
- ISBN-10: 9780863417450
- ISBN-13: 978-0863417450
- Publisher: Institution of Engineering and Technology
- Publication date: 1 May 2008
- Language: English
- Dimensions: 15.75 x 2.54 x 23.11 cm
- Print length: 416 pages
Availability: In Stock
Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits The System On Chip Approach (Pb 2012)
SKU: 9780863417450
Original price was: ₹1,295.00.₹1,100.75Current price is: ₹1,100.75.
Unlock the complexities of modern electronics with ‘Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: The System on Chip Approach’. This essential guide, published by the Institution of Engineering and Technology, delves into the critical aspects of testing and diagnosing integrated circuits, particularly within the context of System-on-Chip (SoC) designs. Ideal for engineers, researchers, and students in the field, this book offers comprehensive insights into the challenges and solutions for ensuring the reliability and performance of analogue, mixed-signal, and RF circuits. Enhance your understanding and master the techniques required for cutting-edge semiconductor development with this authoritative resource from The Bookish Owl.
5 in stock
