Reliability Wearout Mechanisms in Advanced CMOS Technologies: 12 (IEEE Press Series on Microelectronic Systems)
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Reliability Wearout Mechanisms in Advanced CMOS Technologies: 12 (IEEE Press Series on Microelectronic Systems)

SKU: 9780471731726

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Explore the critical challenges in advanced CMOS technologies with ‘Reliability Wearout Mechanisms in Advanced CMOS Technologies: 12’. This essential IEEE Press Series volume, published by Wiley-IEEE Press, delves deep into the fundamental wearout mechanisms that impact the performance and longevity of modern microelectronic systems. Ideal for engineers, researchers, and students in semiconductor and electronics industries, this comprehensive guide provides insights into managing and mitigating reliability issues. Enhance your understanding of device physics and ensure robust designs for next-generation integrated circuits. Discover the latest advancements and practical solutions for extending the life and ensuring the dependability of your electronic products with this definitive resource from The Bookish Owl.

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Description

  • ISBN-10: 0471731722
  • ISBN-13: 978-0471731726
  • Edition: 1st
  • Publisher: Wiley-IEEE Press
  • Publication date: 4 September 2009
  • Language: English
  • Dimensions: 16.38 x 3.43 x 24.26 cm
  • Print length: 624 pages

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