The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™: 35 (Frontiers in Electronic Testing)
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The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™: 35 (Frontiers in Electronic Testing)

SKU: 9780387307510

₹15,999.00

Master the intricate world of embedded core testing with the definitive guide to IEEE Std. 1500. This essential handbook unpacks the rationale and application of sophisticated core test wrappers, addressing critical challenges in modern semiconductor design. Discover practical solutions for reduced I/O mapping, at-speed functional verification, and overcoming limitations of traditional JTAG boundary scan for embedded cores. Perfect for semiconductor engineers, VLSI professionals, and researchers in India, this book is key to advancing your IC testing and verification expertise.

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