Testing Static Random Access Memories: Defects
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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26 (Frontiers in Electronic Testing)

SKU: 9781402077524

₹9,999.00

Master SRAM testing with this essential guide to static random access memories. Delve into realistic fault models, optimized test patterns, and effective test strategies for single-port and multi-port SRAMs. This book provides a complete framework for analyzing memory faults and developing advanced testing algorithms, crucial for reducing defect levels. It’s an indispensable resource for semiconductor engineers, researchers, and students in India seeking to excel in memory design and testing. Explore challenges and trends in embedded memory testing and enhance your expertise in electronic testing.

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