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SCANNING PROBE MICROSCOPY: ELECTRICAL AND ELECTROMECHANICAL PHENOMENA AT THE NANOSCALE, 2 VOLUMES SET

SKU: 9780387286679

29,999.00

Master nanoscale characterization with this comprehensive 2-volume set on Scanning Probe Microscopy (SPM). Delve into the intricate electrical and electromechanical phenomena governing the world at the nanoscale. Essential for advanced physics, materials science, and nanotechnology research, this collection offers deep insights into fundamental principles and cutting-edge applications. It’s an indispensable resource for graduate students and research professionals across India seeking to push the boundaries of scientific discovery. Elevate your understanding of nanoscale behavior with expert-led knowledge.

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