Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Integrated Mircosystems)
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Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Integrated Mircosystems)

SKU: 9781596939899

₹11,092.00

Master Wafer-Level Testing (WLT) and Burn-In for Integrated Circuits (ICs) with this essential guide. Explore cutting-edge Wafer-Level Test During Burn-In (WLTBI) techniques designed to significantly reduce semiconductor manufacturing costs and effectively screen out early device failures. This book is vital for Indian electronics engineers and professionals seeking to implement robust IC testing strategies under various resource constraints. Gain expert insights into enabling next-generation products with existing infrastructure and stay ahead with current industry trends in advanced semiconductor testing solutions.

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