₹11,865.00
Unlock the secrets of material structures with “Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists” at The Bookish Owl. Authored by Dong ZhiLi, this essential guide bridges the crucial structure–property relationship, offering an in-depth understanding of crystal structure analysis. Master powder XRD techniques, explore TEM methodologies, and delve into HRTEM applications. Perfect for materials science students, researchers, and professionals in engineering, applied physics, and chemical engineering. Discover how to interpret diffraction patterns, understand electron scattering, and apply these powerful tools in materials research. Get your copy at The Bookish Owl and elevate your materials science expertise. ISBN: 9780367357948
5 in stock
